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Calculating the Leaf Area Index of Winter Wheat Using the “Double Bases of Satellite to Land” Method
WEI Qingwei, ZHANG Hongwei, REN Liwei
CMA/Henan Key Laboratory of Agro-meteorological Safeguard and Applied Technique, Zhengzhou 450003, China; Henan Meteorological Administration, Zhengzhou 450003, China; Hebi Meteorological Bureau, Hebi 458030, China
Abstract:
Monitoring leaf index of winter wheat using remote sensing was an efficient method to quickly and accurately acquire the growth and spatial distribution of winter wheat at large scales. In this paper we compared the leaf area index (LAI) of winter wheat in March of 2015 and 2016 in Hebi of Henan Province using the “Double Bases of Satellite to Land” method and MODIS. The results showed that the LAIs calculated using the two methods could represent the spatial distribution of winter wheat in this region well. The stability of the MODIS is superior, but the LAI calculated by it is systematically lower than the on-site measurements. In contrast, the results calculated using the “Double Bases of Satellite to Land” agree well with the measurements.
Key words:  double bases of satellite to land; MODIS; leaf area index